Overview

The Device Testing with Digital Pattern Instruments course enables Test and Validation Engineers to perform characterization and production test of semiconductor devices with digital pattern instruments. The course will focus on how digital pattern instruments and the Digital Pattern Editor can be leveraged to perform common device tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing. The course will guide the learner through the complete test workflow, from calibration and debugging to extending tests into a test executive.

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NI

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Device Testing with Digital Pattern Instruments

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Enrollments

Level

Intermediate

Time to Complete:

5 hours 0 minute

Lessons:

128

Certificate:

No

One-time for 1 person

$650.00$515.00

Overview

The Device Testing with Digital Pattern Instruments course enables Test and Validation Engineers to perform characterization and production test of semiconductor devices with digital pattern instruments. The course will focus on how digital pattern instruments and the Digital Pattern Editor can be leveraged to perform common device tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing. The course will guide the learner through the complete test workflow, from calibration and debugging to extending tests into a test executive.

What You’ll Learn?

Create and edit all elements required to burst a digital pattern to your DUT, including pin maps, level sheets, timing sheets, and pattern files
Test DUT modes of operation with SPI commands
Validate DUT communication via register readback testing
Validate DUT timing by interfacing with external test equipment
Validate DUT pin connections via continuity and leakage testing
Utilize opcodes to establish flow control within patterns
Use source and capture waveforms to simplify pattern structure and store data
Synchronize your digital pattern instrument with other instruments in your systems
Use History RAM reports, Shmoo plots, and digital scope to perform debugging activities
Calibrate your instruments and correct for any cable skew
Import a pattern into a test executive

Requirements

LabVIEW or .NET programming experience.

Syllabus Overview

128

Lessons

26

Quizzes

0

Tasks

4

Resources

🟢 Creating a Digital Pattern

01 Creating and Bursting Your First Pattern

00:11

02 Creating Pin Maps

00:15

03 Creating Specifications Sheets

00:24

04 Creating Pin Levels Sheets

00:18

05 Creating Timing Sheets

00:22

06 Creating Pattern Files

00:26

🟢 Programmatically Controlling the Digital Pattern Instrument

07 Programming Digital Patterns

00:31

🟢 Using Digital Patterns to Validate the DUT

08 Testing DUT Modes of Operation

00:20

09 Performing Register Readback Tests

00:14

10 Validating DUT Timing

00:15

11 Performing Continuity and Leakage Testing

00:26

🟢 Customizing the Digital Pattern

12 Increasing Pattern Robustness with Flow Control

00:16

13 Using Source Waveforms

00:42

14 Using Capture Waveforms

00:48

🟢 Debugging the Digital Pattern

15 Reviewing Test Results with History RAM Report

00:34

16 Viewing Signals with Digital Scope

00:45

17 Using Shmoo Plots to Visualize Parameter Relationships

00:50

🟢 Exploring Advanced Topics

18 Synchronizing with Other Instruments

00:39

19 Wiring and Calibration

00:32

20 Using Opcodes for Scan Testing

00:42

Material Includes

NI Digital Pattern Editor 2023 Q4, or later
NI-Digital Pattern Driver 2023 Q4, or later
LabVIEW 2024 Q1, or later
NI PXIe Digital Pattern Instruments

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