Device Testing with Digital Pattern Instruments

About Course

The Device Testing with Digital Pattern Instruments course enables Test and Validation Engineers to perform characterization and production test of semiconductor devices with digital pattern instruments. The course will focus on how digital pattern instruments and the Digital Pattern Editor can be leveraged to perform common device tests, with a focus on DUT communication, digital interface testing, and continuity and leakage testing. The course will guide the learner through the complete test workflow, from calibration and debugging to extending tests into a test executive.

Benefits of the course

Create and edit all elements required to burst a digital pattern to your DUT, including pin maps, level sheets, timing sheets, and pattern files
Test DUT modes of operation with SPI commands
Validate DUT communication via register readback testing
Validate DUT timing by interfacing with external test equipment
Validate DUT pin connections via continuity and leakage testing
Utilize opcodes to establish flow control within patterns
Use source and capture waveforms to simplify pattern structure and store data
Synchronize your digital pattern instrument with other instruments in your systems
Use History RAM reports, Shmoo plots, and digital scope to perform debugging activities
Calibrate your instruments and correct for any cable skew
Import a pattern into a test executive

Course Content

Introduction

00:28
Introducing PXI Digital Pattern Instruments

01:29
Demonstration: Creating and Bursting a Digital Pattern

02:57
Knowledge Check
Summary

00:11

Introduction

00:21
Exploring Pin Maps

00:34
Demonstration: Creating and Editing Pin Maps

06:28
Knowledge Check
Summary

00:15

Introduction

00:32
Exploring Specifications Sheets

01:30
Demonstration: Editing Specifications Sheets

02:05
Knowledge Check
Summary

00:24

Introduction

00:25
Exploring Pin Levels Sheets

01:06
Matching Activity
Demonstration: Editing Pin Levels with Digital Pattern Editor

01:07
Knowledge Check
Summary

00:18

Introduction

00:35
Exploring Timing Sheets

03:34
Matching Activity
Demonstration: Editing Time Sets

06:06
Knowledge Check
Summary

00:22

Introduction

00:42
Introduction to Patterns

06:36
Demonstration: Editing Patterns in Grid View

09:13
Working with Patterns

06:07
Demonstration: Using Edge Multipliers in Patterns

05:20
Knowledge Check
Summary

00:26

Introduction

00:40
Exploring the Digital Pattern Instrument Software Flow

02:04
Creating a Session and Controlling States
Editing Pin Maps with the NI-Digital Pattern API
Demonstration: Editing Pin Maps
Editing Pin Levels with the NI-Digital Pattern API
Demonstration: Editing Pin Levels
Editing Time Sets with the NI-Digital Pattern API
Demonstration: Editing Time Sets
Loading Files with the NI-Digital Pattern API
Demonstration: Loading Files
Matching Activity 1
Matching Activity 2
Knowledge Check
Summary

00:31

Introduction

00:30
Exploring SPI Communication

02:06
Demonstration: SPI Communication with the Example DUT

13:40
Knowledge Check
Summary

00:20

Introduction

00:30
Introducing Register Readback Testing

00:50
Demonstration: Register Readback Testing

05:58
Knowledge Check
Summary

00:14

Introduction

00:25
Introducing DUT Timing Validation

01:37
Demonstration: Validating the Timing of an Example DUT

02:18
Knowledge Check
Summary

00:15

Introduction

00:36
Introduction to Continuity and Leakage Testing

00:31
Exploring Pin Parametric Measurement Unit (PPMU) Fundamentals

00:46
Demonstration: Performing Continuity and Leakage Tests
Knowledge Check
Summary

00:26

Introduction

00:44
Introducing Opcodes in Digital Pattern Editor

01:08
Using Repeat and Loop Opcodes in Pattern

01:38
Demonstration: Using Repeats and Loops

04:43
Exploring Jump and Call Opcodes

01:04
Demonstration: Calling Patterns

03:37
Using Conditional Behavior

01:22
Demonstration: Match Opcode in Patterns

00:54
Exploring Sequencer Flags and Registers

02:04
Matching Activity 1
Knowledge Check
Summary

00:16

Introduction

01:09
Exploring Source Waveforms

02:31
Configuring Serial Source Waveforms

01:57
Creating and Writing Serial Source Waveforms Programmatically
Using Serial Source Waveforms in Patterns

01:16
Exploring Source Pin State Replacement

02:18
Loading and Unloading Source Waveforms

02:16
Demonstration: Configuring Serial Source Waveforms

08:34
Configuring Parallel Source Waveforms

00:50
Creating and Writing Parallel Waveforms Programmatically
Using Parallel Source Waveforms in Patterns

01:04
Demonstration: Using Parallel Source Waveform in Pattern

04:59
Source Bandwidth Considerations

01:16
Knowledge Check
Summary

00:42

Introduction

00:54
Exploring Capture Waveforms

01:08
Configuring Serial Capture Waveforms

00:41
Configuring Serial Capture Waveforms Programmatically
Configuring Parallel Capture Waveforms

00:21
Configuring Parallel Capture Waveforms Programmatically
Using Capture Waveforms in Patterns

01:03
Loading and Unloading Capture Waveforms

01:22
Demonstration: Configuring Capture Waveforms

07:23
Capture Waveform Considerations

00:57
Knowledge Check
Summary

00:48

Introduction

00:52
Exploring History RAM

00:52
Demonstration: Configuring History RAM

01:47
Demonstration: Viewing and Exporting History RAM Results

04:20
Using NI-Digital History RAM API
Memory and Bandwidth Considerations

04:15
Knowledge Check
Summary

00:34

Introduction

00:50
Exploring Digital Scope

00:55
Configuring and Using Digital Scope

00:25
Demonstration: Configuring and Using Digital Scope

02:26
Knowledge Check
Summary

00:45

Introduction

00:51
Exploring Shmoo Plots

00:58
Demonstration: Configuring Shmoo Plots

02:20
Exploring Shmoo Plot Execution Modes

01:09
Demonstration: Running a Shmoo Test

00:59
Knowledge Check
Summary

00:50

Introduction

01:15
Generating Triggers Interactively

01:49
Generating Triggers Programmatically
Demonstration: Using Events to Send Triggers to Other Instruments
Using NI-TClk with Multiple Instruments
Detecting Match or Fail Conditions

02:57
Detecting a Matched or Failed Condition Across Instruments
Synchronization Methods Overview

01:56
Matching Activity
Knowledge Check
Summary

00:39

Introduction

01:07
Configuring Time Domain Reflectometry

01:51
Configuring TDR with NI-Digital Pattern API Programmatically
Demonstration: Visualizing Time-Domain Reflectometry

02:19
Connecting DUT Ground Sense

02:13
Calibrating Digital Pattern Devices

03:01
Knowledge Check
Summary

00:32

Introduction

00:39
Exploring Scan Patterns

03:16
Demonstration: Using the Scan Opcode in Patterns

01:46
Knowledge Check
Summary

00:42

$515.00 ~~$650.00~~

Lessons128
Quizzes26
Skill LevelIntermediate
LanguageEnglish
Course Duration 5h

Device Testing with Digital Pattern Instruments

$515.00 ~~$650.00~~