Test Program Development with STS and LabVIEW

About Course

The Test Program Development with STS and LabVIEW course delivers hands-on training for setting up and using an STS to communicate with a device under the test (DUT). After completing this course, a test engineer will be able to use STS tester resources interactively to create, modify, execute, and debug test programs with pre-existing code modules to collect test data and test time reports.

Benefits of the course

Setup and configure an STS to test a mixed-signal semiconductor device
Use STS tester resources to interactively create, modify, execute, and debug a test program using prewritten code modules
Successfully communicate with a DUT
Understand test program architecture, modify it and configure the execution flow
Create an automated STS test sequence
Modify and run a test program and gather the data
Navigate the Operator Interface
Debug devices, signals, and test sequences with debug panels
Collect test data and generate test reports
Benchmark test time

Course Content

Introduction to NI STS

03:56 Preview
Demonstration: Showing NI STS Components

00:26 Preview
System Overview

31:21 Preview
Demonstration: Launching the STS Maintenance Software

04:46 Preview
Demonstration: Navigating TestStand Sequence Editor

03:04 Preview
Safety Requirements and Specifications

03:50 Preview
Knowledge Check

Recognizing Tester Instrumentation and Resources

01:11
Exploring System Specifications

01:25
Identifying STS Instrumentation

11:54
Demonstration: Finding the Spring Pin Pinout of a Tester Resource

01:06
Calibration in STS

06:17
Knowledge Check

What is the Create STS Project Tool?

01:52
Exploring Created Files

04:56
Demonstration: Create a Test Program and Explore Folder Structure

01:31
Knowledge Check

What is a Pin Map?

02:44
Review Tester Configuration and Load Board Schematic

01:38
Mapping Measurement Requirements

02:02
Demonstration: Assignment of Tester Resources based on Test Plan

02:04
Modifying Pin Mapvvvv

06:31
Demonstration: Using Pin Map Editor

05:33
Knowledge Check

Exploring the Digital Pattern Instrument

04:52
Using the Digital Pattern Editor

06:07
Demonstration: Navigating the Digital Pattern Editor Environment

01:47
Creating Specifications, Levels, and Timing Sheets

13:59
Demonstration: Modifying Specifications and Levels Sheets Using the Digital Pattern Editor

02:21
Demonstration: Modifying a Timing Sheet

02:36
Knowledge Check

Using the DIB to Interface with the DUT

02:37
Checking Continuity and Measuring Leakage Current

02:21
Demonstration: Checking Continuity on DUT Pins

01:47
DUT Bring-Up

00:34
Demonstration: Power-Up the DUT Using the Digital Patter Editor

02:30
Knowledge Check

Learning Vector-Based Patterns

03:25
Creating Basic Digital Patterns to Communicate with the DUT

11:44
Converting Digital Patterns

01:09
Demonstration: Create, Load and Burst Patterns Using the DPE

08:56
Knowledge Check

Exploring the Test Sequence File

05:37
Demonstration: Exploring the Parts of the Sequence File Window

01:03
Adding Steps to a Test Sequence

01:27
Creating Test Steps

02:51
Configuring Step Settings

08:46
Configuration Based Templates Vs. Custom Code Modules

01:00
Controlling TestStand Execution

13:15
Demonstration: Calling the Code Modules and Configuring their Settings

10:08
Demonstration: Using Expressions and Local Variables

06:39
Demonstration: Changing the Order of Execution Using Post Actions

02:10
Knowledge Check

Using Step Templates

03:25
Setting Test Limits

03:04
Creating Test Configurations

02:31
Demonstration: Creating Test Configurations

04:58
Binning

03:03
Demonstration: Using the Bin Definitions Editor

03:40
Executing a Test Program in the Test Development Environment

06:44
Understanding Test Results and Reporting

03:21
Demonstration: Select and Configure Result Processor

04:14
Activity – Matching Pair
Knowledge Check

Test Program Debugging

13:28
Demonstration: Using the Lot Statistics Viewer and Test Execution Profile Panels

06:15
Demonstration: Using Debugging Tools

04:32
Debugging Scenarios

04:52
Benchmarking Test Time

02:30
Using InstrumentStudio for Debugging

05:04
Using the Digital Patter Editor for Debugging

20:57
Demonstration: Configuring HRAM Settings and Viewing Results

02:31
Demonstration: Using the Digital Patter Editor to Debug a Test Program

08:52
Knowledge Check

Exploring OI Features

01:39
Configuring Station and Lot Settings from the OI

00:42
Running a Test Sequence from the OI

02:52
OI Indicators, fields and Functions

04:34
Viewing Test Results and Reports

03:28
Demonstration: Using the STS Operator Interface

05:46
Activity – Matching Pairs 123
Knowledge Check

$515.00 ~~$650.00~~

Lessons69
Quizzes13
Skill LevelIntermediate
LanguageEnglish
Course Duration 6h

Target Audience

Semiconductor Test Engineers using or evaluating the NI Semiconductor Test System (STS) to perform semiconductor production tests or high-volume automated device validation.

Test Program Development with STS and LabVIEW

$515.00 ~~$650.00~~

Test Program Development with STS and LabVIEW

About Course

Benefits of the course

Course Content

System Overview

Knowledge Check

Exploring NI STS Instrumentation

Recognizing Tester Instrumentation and Resources

Exploring System Specifications

Identifying STS Instrumentation

Demonstration: Finding the Spring Pin Pinout of a Tester Resource

Calibration in STS

Knowledge Check

Creating STS Projects

What is the Create STS Project Tool?

Exploring Created Files

Demonstration: Create a Test Program and Explore Folder Structure

Knowledge Check

Mapping STS Hardware to DUT Pins

What is a Pin Map?

Review Tester Configuration and Load Board Schematic

Mapping Measurement Requirements

Demonstration: Assignment of Tester Resources based on Test Plan

Modifying Pin Mapvvvv

Demonstration: Using Pin Map Editor

Knowledge Check

Exploring the Digital Pattern Instrument

Exploring the Digital Pattern Instrument

Using the Digital Pattern Editor

Demonstration: Navigating the Digital Pattern Editor Environment

Creating Specifications, Levels, and Timing Sheets

Demonstration: Modifying Specifications and Levels Sheets Using the Digital Pattern Editor

Demonstration: Modifying a Timing Sheet

Knowledge Check

Validating DUT Behavior

Using the DIB to Interface with the DUT

Checking Continuity and Measuring Leakage Current

Demonstration: Checking Continuity on DUT Pins

DUT Bring-Up

Demonstration: Power-Up the DUT Using the Digital Patter Editor

Knowledge Check

Creating and Bursting Digital Patterns

Learning Vector-Based Patterns

Creating Basic Digital Patterns to Communicate with the DUT

Converting Digital Patterns

Demonstration: Create, Load and Burst Patterns Using the DPE

Knowledge Check

Exploring the STS Software Development Environment

Exploring the Test Sequence File

Demonstration: Exploring the Parts of the Sequence File Window

Adding Steps to a Test Sequence

Creating Test Steps

Configuring Step Settings

Configuration Based Templates Vs. Custom Code Modules

Controlling TestStand Execution

Demonstration: Calling the Code Modules and Configuring their Settings

Demonstration: Using Expressions and Local Variables

Demonstration: Changing the Order of Execution Using Post Actions

Knowledge Check

Configuring Test Program and Steps

Using Step Templates

Setting Test Limits

Creating Test Configurations

Demonstration: Creating Test Configurations

Binning

Demonstration: Using the Bin Definitions Editor

Executing a Test Program in the Test Development Environment

Understanding Test Results and Reporting

Demonstration: Select and Configure Result Processor

Activity – Matching Pair

Knowledge Check

Debugging

Test Program Debugging

Demonstration: Using the Lot Statistics Viewer and Test Execution Profile Panels

Demonstration: Using Debugging Tools

Debugging Scenarios

Benchmarking Test Time

Using InstrumentStudio for Debugging

Using the Digital Patter Editor for Debugging

Demonstration: Configuring HRAM Settings and Viewing Results